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[IEEE SICE 2008 - 47th Annual Conference of the Society of Instrument and Control Engineers of Japan - Chofu (2008.08.20-2008.08.22)] 2008 SICE Annual Conference - 3D shape and specular reflection measurement using image scanner
Ukida, HiroyukiYear:
2008
Language:
english
DOI:
10.1109/sice.2008.4654902
File:
PDF, 502 KB
english, 2008