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[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - A measurement set-up and methodology combining dynamic biasing and baseband predistorsion for high efficiency and linear amplifier design
Saad El Dine, M, Reveyrand, T., Neveux, G., Bouysse, P., Barataud, D., Nebus, J. M., Rebernack, W.Year:
2010
Language:
english
DOI:
10.1109/mwsym.2010.5517612
File:
PDF, 2.20 MB
english, 2010