[IEEE 2008 American Control Conference (ACC '08) - Seattle, WA (2008.06.11-2008.06.13)] 2008 American Control Conference - Feedback scheme for improved lateral force measurement in atomic force microscopy
Shegaonkar, A., Lee, C., Salapaka, S.Year:
2008
Language:
english
DOI:
10.1109/acc.2008.4586982
File:
PDF, 304 KB
english, 2008