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[IEEE IECON 2012 - 38th Annual Conference of IEEE Industrial Electronics - Montreal, QC, Canada (2012.10.25-2012.10.28)] IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society - Enhancing ISO/IEC 25021 quality measure elements for wider application within ISO 25000 series
St-Louis, Dominique, Suryn, WitoldYear:
2012
Language:
english
DOI:
10.1109/iecon.2012.6389400
File:
PDF, 1.14 MB
english, 2012