High-speed imaging upgrade for a standard sample scanning...

Review of Scientific Instruments 2014 / 09 Vol. 85; Iss. 9

High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

Adams, Jonathan D., Nievergelt, Adrian, Erickson, Blake W., Yang, Chen, Dukic, Maja, Fantner, Georg E.
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Volume:
85
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4895460
Date:
September, 2014
File:
PDF, 1.62 MB
english, 2014
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