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[IEEE 2014 International Conference on Nanoscience and Nanotechnology (ICONN) - Adelaide, Australia (2014.2.2-2014.2.6)] 2014 International Conference on Nanoscience and Nanotechnology - The control of higher modes in atomic force microscopy
Karvinen, K. S., Moheimani, S. O. R.Year:
2014
Language:
english
DOI:
10.1109/iconn.2014.6965263
File:
PDF, 521 KB
english, 2014