thin films by scanning tunneling spectroscopy measurements

thin films by scanning tunneling spectroscopy measurements

Di Capua, R., Aebersold, H. U., Ferdeghini, C., Ferrando, V., Orgiani, P., Putti, M., Salluzzo, M., Vaglio, R., Xi, X. X.
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Volume:
75
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.75.014515
Date:
January, 2007
File:
PDF, 96 KB
english, 2007
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