thin films by scanning tunneling spectroscopy measurements
Di Capua, R., Aebersold, H. U., Ferdeghini, C., Ferrando, V., Orgiani, P., Putti, M., Salluzzo, M., Vaglio, R., Xi, X. X.Volume:
75
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.75.014515
Date:
January, 2007
File:
PDF, 96 KB
english, 2007