Random Berry phase magnetoresistance as a probe of...

Random Berry phase magnetoresistance as a probe of interface roughness in Si MOSFET’s

Mathur, H., Baranger, Harold U.
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Volume:
64
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.64.235325
Date:
November, 2001
File:
PDF, 309 KB
english, 2001
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