Multiple diffraction lines in the synchrotron x-ray topographs of elastically bent silicon single crystals
Tuomi, T., Naukkarinen, K.Volume:
24
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.24.6125
Date:
November, 1981
File:
PDF, 506 KB
english, 1981