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[IEEE Proceedings of 2005 International Symposium on Electrical Insulating Materials, 2005. (ISEIM 2005). - Kitakyushu, Japan (2005.06.5-2005.06.9)] Proceedings of 2005 International Symposium on Electrical Insulating Materials, 2005. (ISEIM 2005). - Microscopic characteristic and signal analysis of aging defects in epoxy/mica insulation bar under different stresses
Xiaohong Zhang,, Chunxiu Hu,, Junguo Gao,, Qingjuan Hu,Year:
2005
Language:
english
DOI:
10.1109/iseim.2005.193469
File:
PDF, 715 KB
english, 2005