Depth profiles of interstitial halogen defects in...

Physical Review B 1996 / 5 Vol. 53; Iss. 17

Depth profiles of interstitial halogen defects in high-energy ion-bombarded RbI by micro-Raman spectroscopy

Pariselle, M. A., Lefrant, S., Balanzat, E., Ramstein, B., Comins, J. D.
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Volume:
53
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.53.11365
Date:
May, 1996
File:
PDF, 62 KB
english, 1996
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