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[IEEE 2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO) - Toronto, ON, Canada (2014.8.18-2014.8.21)] 14th IEEE International Conference on Nanotechnology - Resistance uniformity of TiO2 memristor with different thin film thickness

Nuo Xu,, Fang, Liang, Chi, Yaqing, Chao Zhang,, Tang, Zhensen
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Year:
2014
Language:
english
DOI:
10.1109/NANO.2014.6968102
File:
PDF, 811 KB
english, 2014
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