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A method for measuring in-plane unidirectional electrical properties in a wide band-gap semiconductor using a Brillouin scattering method
Yanagitani, Takahiko, Sano, Hiroyuki, Matsukawa, MamiVolume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3448203
File:
PDF, 953 KB
english, 2010