[IEEE 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) - Lake Buena Vista, FL, USA (2011.05.31-2011.06.3)] 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) - Method for early detection of PCB bending induced pad cratering
Bansal, Anurag, Ramakrishna, Gnyaneshwar, Liu, Kuo-ChuanYear:
2011
Language:
english
DOI:
10.1109/ectc.2011.5898672
File:
PDF, 1.53 MB
english, 2011