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[IEEE 2006 IEEE International Conference on Industrial Technology - Mumbai, India (2006.12.15-2006.12.17)] 2006 IEEE International Conference on Industrial Technology - Study on Solving Method of Data Envelopment Analysis (DEA) Mark-Post Values Based on Benchmarking
Wang, Xiao-lin, Zhang, Yun, Qing, Zhao-boYear:
2006
Language:
english
DOI:
10.1109/icit.2006.372686
File:
PDF, 285 KB
english, 2006