SELECTING A TEMPERATURE TIME HISTORY FOR PREDICTING FATIGUE LIFE OF MICROELECTRONICS SOLDER JOINTS
Basaran, Cemal, Dishongh, Terry, Zhao, YingVolume:
24
Language:
english
Journal:
Journal of Thermal Stresses
DOI:
10.1080/01495730152620069
Date:
November, 2001
File:
PDF, 1.24 MB
english, 2001