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[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - BIST-Guided ATPG
Al-Yamani, A.A., McCluskey, E.J.Year:
2005
Language:
english
DOI:
10.1109/isqed.2005.26
File:
PDF, 160 KB
english, 2005