[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Frequency and recovery effects in high-κ BTI degradation
Ramey, Stephen, Prasad, Chetan, Agostinelli, Marty, Pae, Sangwoo, Walstra, Steven, Gupta, Satrajit, Hicks, JeffreyYear:
2009
Language:
english
DOI:
10.1109/irps.2009.5173404
File:
PDF, 356 KB
english, 2009