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X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy
M. Meduňa, V. Holý, T. Roch, J. Stangl, G. Bauer, J. Zhu, K. Brunner, G. AbstreiterYear:
2001
Language:
english
DOI:
10.1063/1.1359156
File:
PDF, 946 KB
english, 2001