Interfacial roughness and carrier scattering due to misfit dislocations in In[sub 0.52]Al[sub 0.48]As/In[sub 0.75]Ga[sub 0.25]As/InP structures
M. Naidenkova, M. S. Goorsky, R. Sandhu, R. Hsing, M. Wojtowicz, T. P. Chin, T. R. Block, D. C. StreitYear:
2002
Language:
english
DOI:
10.1116/1.1477201
File:
PDF, 680 KB
english, 2002