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[IEEE Factory Automation (ETFA 2010) - Bilbao (2010.09.13-2010.09.16)] 2010 IEEE 15th Conference on Emerging Technologies & Factory Automation (ETFA 2010) - Variable and delay selection using neural networks and mutual information for data-driven soft sensors
Souza, F, Santos, P, Araújo, RYear:
2010
Language:
english
DOI:
10.1109/etfa.2010.5641329
File:
PDF, 200 KB
english, 2010