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[IEEE IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (1-3 May 1990)] IEEE International Symposium on Circuits and Systems - A new SPICE-compatible model and related self-consistent parameter extraction for the dual-gate JFET
Van Halen, P., Lloyd, S., Metcalf, M., Moore, A., Severson, F.Year:
1990
Language:
english
DOI:
10.1109/iscas.1990.111922
File:
PDF, 294 KB
english, 1990