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[IEEE IC's (ISPSD) - Barcelona, Spain (2009.06.14-2009.06.18)] 2009 21st International Symposium on Power Semiconductor Devices & IC's - Determination of transient transistor capacitances of high voltage MOSFETs from dynamic measurements
Hoch, Vera, Petzoldt, Jurgen, Jacobs, Heiner, Schlogl, Andreas, Deboy, GeraldYear:
2009
Language:
english
DOI:
10.1109/ispsd.2009.5158023
File:
PDF, 292 KB
english, 2009