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[IEEE 1995 International Symposium on VLSI Technology, Systems, and Applications. - Taipei, Taiwan (31 May-2 June 1995)] 1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers - Diagonal MOSFETs characterization for 256M DRAM and beyond
Yin Hu,, Teng, C.W., Coleman, D.J., Richardson, W.F., Jiann Liu,, Chi-Chien Ho,, Aur, S.Year:
1995
Language:
english
DOI:
10.1109/vtsa.1995.524709
File:
PDF, 331 KB
english, 1995