[Int. Test. Conference IEEE Computer Society International...

[Int. Test. Conference IEEE Computer Society International Test Conference (ICSM'99) - Atlantic City, NJ, USA (28-30 Sept. 1999)] International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) - Industrial evaluation of stress combinations for march tests applied to SRAMs

Schanstra, I., Van De Goor, A.J.

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Year:

1999

Language:

english

DOI:

10.1109/test.1999.805831

File:

PDF, 951 KB

english, 1999

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