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Spectral and Injection Level Dependence of Recombination Lifetimes in Silicon Measured by Impedance Spectroscopy
Kumar, Sanjai, Vandana,, Rauthan, C. M. S., Kaul, V. K., Singh, S. N., Singh, P. K.Volume:
4
Language:
english
Journal:
IEEE Journal of Photovoltaics
DOI:
10.1109/jphotov.2013.2288524
Date:
January, 2014
File:
PDF, 487 KB
english, 2014