![](/img/cover-not-exists.png)
[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - An analytical extraction method for scalable substrate resistance model in RF MOSFETs
Shih-Ping Kao,, Chih-Yuan Lee,, Chuan-Yu Wang,, Joseph Der-Son Deng,, Chen-Chai Chang,, Chin-Hsing Kao,Year:
2007
Language:
english
DOI:
10.1109/isdrs.2007.4422453
File:
PDF, 233 KB
english, 2007