[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Reliability-Aware Exceptions: Tolerating intermittent faults in microprocessor array structures
Dweik, Waleed, Annavaram, Murali, Dubois, MichelYear:
2014
Language:
english
DOI:
10.7873/date.2014.114
File:
PDF, 292 KB
english, 2014