[IEEE Conference Publications Design Automation and Test in...

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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Reliability-Aware Exceptions: Tolerating intermittent faults in microprocessor array structures

Dweik, Waleed, Annavaram, Murali, Dubois, Michel
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Year:
2014
Language:
english
DOI:
10.7873/date.2014.114
File:
PDF, 292 KB
english, 2014
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