Topographic and crystallographic characterization of a...

Physical Review B 1997 / 8 Vol. 56; Iss. 7

Topographic and crystallographic characterization of a grazing-ion-bombarded GaAs(110) surface by time-of-flight ion-scattering spectrometry

Gayone, J. E., Pregliasco, R. G., Gómez, G. R., Sánchez, E. A., Grizzi, O.
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Volume:
56
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.56.4186
Date:
August, 1997
File:
PDF, 178 KB
english, 1997
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