A Fault Tolerant Approach to Detect Transient Faults in Microprocessors Based on a Non-Intrusive Reconfigurable Hardware
Azambuja, José Rodrigo, Pagliarini, Samuel, Altieri, Mauricio, Kastensmidt, Fernanda Lima, Hubner, Michael, Becker, Jürgen, Foucard, Gilles, Velazco, RaoulVolume:
59
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2012.2201750
Date:
August, 2012
File:
PDF, 710 KB
english, 2012