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Experimental study and modeling of reverse-bias dark currents in PIN structures using amorphous and polymorphous silicon
S. Tchakarov, P. Roca I Cabarrocas, U. Dutta, P. Chatterjee, B. EquerYear:
2003
Language:
english
DOI:
10.1063/1.1624482
File:
PDF, 421 KB
english, 2003