Optical characterization of free electron concentration in...

Optical characterization of free electron concentration in heteroepitaxial InN layers using Fourier transform infrared spectroscopy and a 2 × 2 transfer-matrix algebra

Katsidis, C. C., Ajagunna, A. O., Georgakilas, A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
113
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4792259
File:
PDF, 1.90 MB
english, 2013
Conversion to is in progress
Conversion to is failed