Optical characterization of free electron concentration in heteroepitaxial InN layers using Fourier transform infrared spectroscopy and a 2 × 2 transfer-matrix algebra
Katsidis, C. C., Ajagunna, A. O., Georgakilas, A.Volume:
113
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4792259
File:
PDF, 1.90 MB
english, 2013