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determined by ellipsometry
Henn, R., Kircher, J., Cardona, M., Wittlin, A., Duijn, V. H. M., Menovsky, A. A.Volume:
53
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.53.9353
Date:
April, 1996
File:
PDF, 153 KB
english, 1996