[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - Susceptibility of Electronic Devices to Variable Transient Spectra
Korte, Sven, Garbe, HeynoYear:
2007
Language:
english
DOI:
10.1109/isemc.2007.175
File:
PDF, 507 KB
english, 2007