[IEEE 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Penang, Malaysia (2008.11.4-2008.11.6)] 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - The superior drop test performance of SAC-Ti solders and its mechanism
Weiping Liu,, Bachorik, Paul, Ning-Cheng Lee,Year:
2008
Language:
english
DOI:
10.1109/iemt.2008.5507779
File:
PDF, 4.17 MB
english, 2008