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High resolution scanning tunnelling microscopy and extended x-ray-absorption fine structure study of the (5 × 3) silicide structure on Cu(001)
Lalmi, B., Chorro, M., Belkhou, R.Volume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4817761
File:
PDF, 1.33 MB
english, 2013