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[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - The study of sensitive circuit and layout for CDM improvement
Jian-Hsing Lee,, Shih, J.R., Shawn Guo,, Dao-Hong Yang,, Chen, Jone F., Su, David, Wu, KennethYear:
2009
Language:
english
DOI:
10.1109/ipfa.2009.5232664
File:
PDF, 6.91 MB
english, 2009