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[IEEE 1998 Fourth International High Temperature Electronics Conference. HITEC - Albuquerque, NM, USA (14-18 June 1998)] 1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145) - The nature of high-temperature instability in fully depleted SOI IM n-MOSFETs
Nazarov, A.N., Barchuk, I.P., Colinge, J.-P.Year:
1998
Language:
english
DOI:
10.1109/hitec.1998.676792
File:
PDF, 366 KB
english, 1998