[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Improving STT-MRAM density through multibit error correction
Bel, Brandon Del, Kim, Jongyeon, Kim, Chris H., Sapatnekar, Sachin S.Year:
2014
Language:
english
DOI:
10.7873/date.2014.195
File:
PDF, 288 KB
english, 2014