[IEEE The 2002 International Conference on Control and Automation, 2002. ICCA. Final Program and Book of Abstracts. - Xiamen, Fujian Province, China (June 16-19, 2002)] The 2002 International Conference on Control and Automation, 2002. ICCA. Final Program and Book of Abstracts. - Seff-organizing pattern base and its application in the complex industrial process

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