Thickness measurement of organic films using Compton scattering of characteristic X-rays
Jong-Yun Kim, Yong Suk Choi, Yong Joon Park, Kyuseok Song, Sung-Hee Jung, Esam M.A. HusseinVolume:
69
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.apradiso.2011.03.048
File:
PDF, 1.07 MB
english, 2011