Thickness measurement of organic films using Compton...

Thickness measurement of organic films using Compton scattering of characteristic X-rays

Jong-Yun Kim, Yong Suk Choi, Yong Joon Park, Kyuseok Song, Sung-Hee Jung, Esam M.A. Hussein
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Volume:
69
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.apradiso.2011.03.048
File:
PDF, 1.07 MB
english, 2011
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