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Analysis of carrier generation lifetime in strained-Si/SiGe heterojunction MOSFETs from capacitance transient
L.K. Bera, Shajan Mathew, N. Balasubramanian, G. Braithwaite, M.T. Currie, F. Singaporewala, J. Yap, R. Hammond, A. Lochtefeld, M.T. Bulsara, E.A. FitzgeraldVolume:
224
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2003.08.054
File:
PDF, 227 KB
english, 2004