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[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Effect of Passivation on Increasing of AlGaN/GaN HEMT Gate Reverse Leakage
Chengzhan, Li, Jian, Liu, Xinyu, Liu, Guoguo, Liu, Dan, Liu, Xiaojuan, Chen, Zhijing, HeYear:
2006
Language:
english
DOI:
10.1109/icsict.2006.306568
File:
PDF, 74 KB
english, 2006