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Study of δ-doped GaAs layers by micro-Raman spectroscopy on bevelled samples
R Srnanek, J Geurts, M Lentze, G Irmer, D Donoval, P Brdecka, P Kordos, A Förster, B Sciana, D Radziewicz, M TlaczalaVolume:
230
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.apsusc.2004.02.056
File:
PDF, 201 KB
english, 2004