Ga+ TOF-SIMS lineshape analysis for resolution enhancement...

Applied Surface Science 2004 Vol. 231-232; Iss. none

Ga+ TOF-SIMS lineshape analysis for resolution enhancement of MALDI MS spectra of a peptide mixture

D.I. Malyarenko, H. Chen, A.L. Wilkerson, E.R. Tracy, W.E. Cooke, D.M. Manos, M. Sasinowski, O.J. Semmes
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Volume:
231-232
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2004.03.097
File:
PDF, 122 KB
english, 2004
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