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[IEEE 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Ho Chi Minh City, Vietnam (2010.01.13-2010.01.15)] 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Estimating Error-probability and its Application for Optimizing Roll-back Recovery with Checkpointing
Nikolov, Dimitar, Ingelsson, Urban, Singh, Virendra, Larsson, ErikYear:
2010
Language:
english
DOI:
10.1109/delta.2010.25
File:
PDF, 265 KB
english, 2010