Surface electronic structure of Si(001)2×2-In studied by...

Surface electronic structure of Si(001)2×2-In studied by angle-resolved photoelectron spectroscopy

Yeom, H. W., Abukawa, T., Takakuwa, Y., Mori, Y., Shimatani, T., Kakizaki, A., Kono, S.
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Volume:
53
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.53.1948
Date:
January, 1996
File:
PDF, 683 KB
english, 1996
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