Comparison between optical techniques and confocal...

Comparison between optical techniques and confocal microscopy for defect detection on thin wires

Philip Siegmann, Luis Miguel Sanchez-Brea, Juan Carlos Martinez-Anton, Eusebio Bernabeu
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Volume:
238
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.apsusc.2004.05.240
File:
PDF, 224 KB
english, 2004
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