Membrane surface modification and characterization by X-ray...

Membrane surface modification and characterization by X-ray photoelectron spectroscopy, atomic force microscopy and contact angle measurements

M. Khayet
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Volume:
238
Year:
2004
Language:
english
Pages:
4
DOI:
10.1016/j.apsusc.2004.05.259
File:
PDF, 148 KB
english, 2004
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