[IEEE 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013 - Seattle, WA, USA (2013.06.2-2013.06.7)] 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) - Terahertz 7-port reflectometer for S-parameter measurements
Yao, Jijun, Wah, Michael Chia YanYear:
2013
Language:
english
DOI:
10.1109/mwsym.2013.6697694
File:
PDF, 290 KB
english, 2013